Senior Electron Microscopy Engineer: Defect & Yield Lead

Applied Optoelectronics, Inc. (AOI) in Sugar Land, TX seeks a Senior Electron Microscopy Engineer to lead advanced microscopy for failure analysis and yield improvement. You will own FIB/SEM/EDX-TEM methods, develop sample-prep techniques, and correlate defects with device processes. PhD with 5+ years in industry is preferred, with hands-on expertise in plan-view TEM specimens and lamellae. You will supervise lab operations and collaborate across R&D, Yield, and Process teams.